Mechanical characterization of carbon nanomembranes from self-assembled monolayers

Published on December 23, 2011

The mechanical characterization of carbon nanomembranes in an atomic force microscope (AFM) is presented in this video. The nanomembranes with a thickness of 1 nm are fabricated by electron-induced cross-linking of aromatic self-assembled monolayers. A novel type of in-situ bulge test in the AFM is utilized to investigate their mechanical properties.

Gölzhäuser Group | Bielefeld University, Germany

Prof. Dr. Armin Gölzhäuser is professor of experimental physics at Bielefeld University. His research interests are centered on surface studies, two-dimensional functional nanomaterials, nanomembranes, graphene and graphenoids, chemical nanolithography, electron-molecule interactions, LEEPS microscopy and helium ion microscopy.

Dr. Andre Beyer is an assistant lecturer and senior scientist in experimental physics at Bielefeld University.

Dr. Xianghui Zhang is a postdoctoral scientist in Prof. Gölzhäuser’s group at Bielefeld University.

Sources

The original research article is published in the Open Access Beilstein Journal of Nanotechnology and is part of the Thematic Series Self-assembly at solid surfaces.

Zhang, X.; Beyer, A.; Gölzhäuser, A., Mechanical characterization of carbon nanomembranes from self-assembled monolayers, Beilstein J. Nanotechnol. 2011, 2, 826–833. doi:10.3762/bjnano.2.92

Original research article:

Zhang, X.; Beyer, A.; Gölzhäuser, A. Beilstein J. Nanotechnol. 2011, 2, 826–833. doi:10.3762/bjnano.2.92

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